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BELAS Summer School 2018

Invited Talks

1. Electromagnetic Compatibility of Integrated Circuits – An Introduction to EMC Test Methods

Sonia Ben Dhia
LAAS-INSA/Toulouse, France

Bernd Deutschmann
Technical University of Graz, Austria


Abstract:

Very complex electronic systems often consisting of large digital cores, analog and mixed-signal circuits, as well as power electronic devices can nowadays be realized in one single chip. But, as device dimensions are shrinking, ICs are often becoming more susceptible to electromagnetic interferences. On the other hand the internal switching frequencies of modern ICs are significantly increasing, resulting in higher electromagnetic emissions. In many cases electronic devices and systems do not pass the electromagnetic compatibility (EMC) tests right away. The reason is very often an insufficient immunity and high electromagnetic emissions of the used ICs. Noise signals for example such as radio-frequency interferences or transient disturbances like electrostatic discharges (ESD) can interfere with the operation of the ICs and particularly with the analog circuits embedded in such devices. Additional costs for improvements or redesigns of the affected products can be avoided if EMC tests of ICs are done once the first prototype of an IC is available and EMC issues are identified in an early stage. This talk gives a short introduction to EMC at the IC-level as well as an overview of the most important EMC test methods and measurement techniques that are used to characterize the emission and immunity of ICs.


Short Bios:

Sonia Ben Dhia
Full professor at INSA-Toulouse (French engineering institute) since 2000, Department of Electrical and Computer Engineering, she teaches digital electronics, IC testability and reliability, and analog and RF CMOS design. CEO of INSA Euro-Méditerranée, Fès, Morocco (2014-2017), she is responsible for the overall leadership and management of this new engineering institute. This includes curriculum development, students recruitment, staff and students development, research leadership as well as national and international professional and academic linkages. Her research interests at LAAS – CNRS Toulouse include signal integrity in nano-scale CMOS ICs, electromagnetic compatibility and reliability of ICs. She has authored and co-authored 3 books, more than 100 publications in peer-reviewed journals & conference proceedings and supervised 13 PhD theses and 8 M.Sc. theses.



2. Are Self-Driving Cars Reliable? Evaluation of Radiation-Induced Errors in GPUs for Automotive Applications

Prof. Paolo Rech
Informatics Institute, Federal University of Rio Grande do Sul - UFRGS, Brazil

Abstract:
The new trend in the automotive market is self-driving system. To be implemented, a self-driving platform needs to be able to analyze a huge amount of images and signals in real time. Graphics Processing Units (GPUs), thanks to their low cost, increased energy efficiency, and flexible development platforms, are extremely attractive for the automotive market. The Tesla self-driving system, for instance, is powered by NVIDIA embedded GPUs. GPUs were originally designed for multimedia applications, for which reliability is not an issue. Their architecture is then optimized to increase performances, not reliability. In the talk we will discuss the reliability of GPUs and evaluate if they are compliant with the strict ISO 26262, which is the standard that define the reliability constraints for automotive applications. The talk will focus on the reliability of pedestrian-detection algorithm and convolution neutral networks (including YOLO and Faster RCNN).We will understand how to identify radiation-induced errors in GPUs and distinguish between tolerable errors and critical errors. After a brief description of radiation effects at physical level we will show the real impact of neutrons in GPUs by presenting accelerated neutron beam results that correspond to more than 150,000 years of natural exposure. Our data demonstrates that most of radiation-induced errors in GPUs can be tolerated, even in safety-critical applications. We will show how to replicate the causes of critical errors through architectural-level and instruction-level fault-injection. By hardening only critical error sources, we will be able to increase the reliability of the application without unnecessary overhead.

Keywords: Design and test of reliable systems, thermal-aware design and test techniques, cyber-physical systems

Short Bio:
Paolo Rech received his master and Ph.D. degrees from Padova University, Padova, Italy, in 2006 and 2009, respectively. His studies included radiation tests and the effect of neutrons, protons, and alpha particles on programmable devices like FPGAs and Systems on Chip. He was a Post Doc at LIRMM, Montpellier, France from 2010 to 2012, working on radiation effects on electronic devices at high altitudes. He is currently an associate professor at the Federal University of Rio Grande do Sul, Porto Alegre, RS, Brazil. His main research interests include the evaluation and mitigation of radiation-induced effects in devices designed for automotive applications and large-scale HPC centers.

 

 

The Organizing Committee, Porto Alegre (Brazil)