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BELAS Summer School 2018

Topics of Interest

- Analog Mixed Signal Test
- Automatic Test Generation
- Built-In Self-Test
- Defect-Based Test
- Design and Synthesis for Testability
- Design for Electromagnetic Compatibility
- Design for Reliable Embedded Software
- Design Verification/Validation
- Economics of Test
- Fault Analysis and Diagnosis
- Fault Modeling and Simulation
- Fault-Tolerance in HW/SW
- Fault-Tolerant Architectures
- Hardening Techniques
- Hardware Security
- Memory Test and Repair
- On-Line Testing
- Process Control and Measurements
- Radiation/EMI
- Software Fault-Tolerance
- Software On-Line Testing
- System-on-Chip Test
- Test Resource Partitioning
- Yield Optimization

 

 

The Organizing Committee, Porto Alegre (Brazil)